The applicability of a model to the degenerate InN

dc.contributor.authorGökden, Sibel
dc.contributor.authorTeke, Ali
dc.contributor.authorBaran, Roman
dc.date.accessioned2019-10-17T08:25:45Z
dc.date.available2019-10-17T08:25:45Z
dc.date.issued2007en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionGökden, Sibel (Balikesir Author)en_US
dc.description.abstractThis paper presents a theoretical study of the carrier mobility in Indium Nitride (InN) material system. We used a model, referred to as alpha-model, based on a simplified relationship between the donor and dislocation densities, N-D = alpha(N-dis/c). It has been shown that this model correctly predicts the low temperature mobilities in InN/sapphire lattice mismatched system with high concentrations of impurities, point defects, and dislocations. It yields important information on the donors and dislocations in the InN/Al2O3 interface region. The donor and dislocation concentrations were calculated and compared favorably with the recently reported Hall mobility data. The specific a value was calculated for InN and its validity was confirmed. The predicted and experimental results also suggested that the potential candidate for dominant donor in InN is hydrogen.en_US
dc.identifier.endpage60en_US
dc.identifier.issn1842-6573
dc.identifier.issn2065-3824
dc.identifier.issue2en_US
dc.identifier.startpage57en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7986
dc.identifier.volume1en_US
dc.identifier.wosWOS:000253707200003
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.language.isoenen_US
dc.publisherNatl Inst Optoelectronicsen_US
dc.relation.ispartofOptoelectronics and Advanced Materials-Rapid Communicationsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectInnen_US
dc.subjectLattice Mismatcheden_US
dc.subjectDislocationen_US
dc.subjectImpurityen_US
dc.subjectDegenerateen_US
dc.titleThe applicability of a model to the degenerate InNen_US
dc.typeArticleen_US

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