Excitonic fine structure and recombination dynamics in single-crystalline ZnO

dc.authorid0000-0002-8141-3768en_US
dc.authorid0000-0001-9785-4990en_US
dc.contributor.authorTeke, Ali
dc.contributor.authorÖzgür, Ümit
dc.contributor.authorDoğan, Seydi
dc.contributor.authorGu, Xing
dc.contributor.authorMorkoç, Hadisen_US
dc.contributor.authorNemeth, Billen_US
dc.contributor.authorNause, J.en_US
dc.contributor.authorEveritt, Henry O.en_US
dc.date.accessioned2019-10-17T07:53:02Z
dc.date.available2019-10-17T07:53:02Z
dc.date.issued2004en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionTeke, Ali (Balikesir Author)en_US
dc.description.abstractThe optical properties of a high quality bulk ZnO, thermally post treated in a forming gas environment are investigated by temperature dependent continuous wave and time-resolved photoluminescence (PL) measurements. Several bound and free exciton transitions along with their first excited states have been observed at low temperatures, with the main neutral-donor-bound exciton peak at 3.3605 eV having a linewidth of 0.7 meV and dominating the PL spectrum at 10 K. This bound exciton transition was visible only below 150 K, whereas the A-free exciton transition at 3.3771 eV persisted up to room temperature. A-free exciton binding energy of 60 meV is obtained from the position of the excited states of the free excitons. Additional intrinsic and extrinsic fine structures such as polariton, two-electron satellites, donor-acceptor pair transitions, and longitudinal optical-phonon replicas have also been observed and investigated in detail. Time-resolved PL measurements at room temperature reveal a biexponential decay behavior with typical decay constants of similar to170 and similar to864 ps for the as-grown sample. Thermal treatment is observed to increase the carrier lifetimes when performed in a forming gas environment.en_US
dc.identifier.doi10.1103/PhysRevB.70.195207
dc.identifier.issn2469-9950
dc.identifier.issn2469-9969
dc.identifier.issue19en_US
dc.identifier.scopus2-s2.0-12444303205
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1103/PhysRevB.70.195207
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7753
dc.identifier.volume70en_US
dc.identifier.wosWOS:000225477800069
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherAmer Chemical Socen_US
dc.relation.ispartofPhysical Review Ben_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectTemperature-Dependenceen_US
dc.subjectPhotoluminescence Lifetimeen_US
dc.subjectEpitaxial Layersen_US
dc.subjectSemiconductorsen_US
dc.subjectTransitionsen_US
dc.subjectPolaritonen_US
dc.subjectSpectrumen_US
dc.subjectFilmsen_US
dc.subjectZinc-Oxideen_US
dc.subjectEnergyen_US
dc.titleExcitonic fine structure and recombination dynamics in single-crystalline ZnOen_US
dc.typeArticleen_US

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