Momentum relaxation of electrons in n-type bulk GaN

dc.contributor.authorZanato, D
dc.contributor.authorGökden, Sibel
dc.contributor.authorBalkan, Naci
dc.contributor.authorRidley, Brian
dc.contributor.authorSchaff, Wiliam J
dc.date.accessioned2019-10-17T08:05:12Z
dc.date.available2019-10-17T08:05:12Z
dc.date.issued2003en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionGökten, Sibel (Balikesir Author)en_US
dc.description.abstractWe report on Hall mobility and carrier density measurements on n-type GaN epilayers grown on sapphire by MBE. The results are discussed using a theoretical model that takes into account the most important scattering mechanisms contributing to determining the mobility of electrons in 3D. We show that polar-optical phonon scattering and dislocation scattering dominate at high temperatures especially in samples with low carrier density, while impurity and dislocation scattering take over at low temperatures.en_US
dc.identifier.doi10.1016/j.spmi.2004.02.022
dc.identifier.endpage85en_US
dc.identifier.issn0749-6036
dc.identifier.issue1-2en_US
dc.identifier.scopus2-s2.0-9944250677
dc.identifier.scopusqualityN/A
dc.identifier.startpage77en_US
dc.identifier.urihttps://doi.org/10.1016/j.spmi.2004.02.022
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7854
dc.identifier.volume34en_US
dc.identifier.wosWOS:000222268500006
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.language.isoenen_US
dc.publisherAdemic Press Ltd-Elsevier Science Ltden_US
dc.relation.ispartofSuperlattices and Microstructuresen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.subjectDislocation Scatteringen_US
dc.subjectMobilityen_US
dc.subjectDonorsen_US
dc.titleMomentum relaxation of electrons in n-type bulk GaNen_US
dc.typeArticleen_US

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