Monte-Carlo calculations of low energy positrons in copper

dc.contributor.authorÖzmutlu, Emine Nurhan
dc.contributor.authorAydın, Asuman
dc.date.accessioned2019-10-17T06:41:56Z
dc.date.available2019-10-17T06:41:56Z
dc.date.issued1996en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionAydın, Asuman (Balikesir Author)en_US
dc.description.abstractAn analogue Monte-Carlo code has been used to simulate the transport of positrons in copper with an incoming energy range of 60 eV-30 keV. The simulation technique is based mainly on the screened Rutherford differential cross section with a spin relativistic correction factor for elastic scattering including some extra total cross section information for low energies, Gryzinski's semi-empirical expression was used to simulate energy loss due to inelastic scattering and the Liljequist and Gryzinski models to calculate the total inelastic scattering cross section. The calculated results are compared with experimental data and those from other calculations. Good agreement is observed except in cases of backscattering.en_US
dc.identifier.doi10.1016/0969-8043(95)00229-4
dc.identifier.endpage189en_US
dc.identifier.issn0969-8043
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-0029988501
dc.identifier.scopusqualityQ2
dc.identifier.startpage185en_US
dc.identifier.urihttp.//10.1016/0969-8043(95) 00229-4
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7351
dc.identifier.volume47en_US
dc.identifier.wosWOS:A1996TX52200008
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherPergamon-Elsevier Science Ltden_US
dc.relation.ispartofApplied Radiation and İsotopesen_US
dc.relation.publicationcategoryMakale - Ulusal Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.subjectElastic-Scatteringen_US
dc.subjectElectronsen_US
dc.subjectSolidsen_US
dc.titleMonte-Carlo calculations of low energy positrons in copperen_US
dc.typeArticleen_US

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