p-GaN-i-GaN/AlGaN multiple-quantum well n-AlGaN back-illuminated ultraviolet detectors

dc.authorid0000-0001-9785-4990en_US
dc.contributor.authorTeke, Ali
dc.contributor.authorDoğan, Seydi
dc.contributor.authorHuang, D
dc.contributor.authorYun, F
dc.contributor.authorMikkelson, M
dc.contributor.authorMorkoc, H,
dc.date.accessioned2019-10-17T07:58:35Z
dc.date.available2019-10-17T07:58:35Z
dc.date.issued2003en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionTeke, Ali (Balikesir Author)en_US
dc.description.abstractThe spectral response of back-surface-illuminated p-GaN-i-GaN/AlGaN multiple-quantum well (MQW)-n-AlGaN ultraviolet (UV) photodetector is reported. The structure was grown by molecular-beam epitaxy on a c-plane sapphire substrate. A MQW is introduced into the active region of the device to enhance the quantum efficiency caused by the high absorption coefficient of the two-dimensional (2-D) system. Another advantage of using MQW in the active region is the ability to tune the cutoff wavelength of the photodetector by adjusting the well width, well composition, and barrier height. The zero-bias peak responsivity was found to be 0.095 A/W at 330 nm, which corresponds to 36% quantum efficiency from as-grown p-i-n GaN/AlGaN MQW devices. An anomalous effect, occurring in responsivity as a negative photoresponse in the spectra peaked at 362 nm because of poor ohmic contact to p-type GaN, was also observed. Etching the sample in KOH for 30 sec before fabrication removed the surface contaminants and improved the surface smoothness of the as-grown sample, resulting in significant improvement in the device performance, giving a peak responsivity of 0.12 A/W. The device has a quantum efficiency of 45% at 330 nm without the anomalous negative photocurrent.en_US
dc.identifier.doi10.1007/s11664-003-0149-4
dc.identifier.endpage311en_US
dc.identifier.issn0361-5235
dc.identifier.issue5en_US
dc.identifier.scopus2-s2.0-0037650108
dc.identifier.scopusqualityQ2
dc.identifier.startpage307en_US
dc.identifier.uri10.1007/s11664-003-0149-4
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7803
dc.identifier.volume32en_US
dc.identifier.wosWOS:000182770100004
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.language.isoenen_US
dc.publisherMinerals Metals Materials Soen_US
dc.relation.ispartofJournal of Electronic Materialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.subjectGan/Alganen_US
dc.subjectMbeen_US
dc.subjectMqwen_US
dc.subjectUltraviolet Detectoren_US
dc.titlep-GaN-i-GaN/AlGaN multiple-quantum well n-AlGaN back-illuminated ultraviolet detectorsen_US
dc.typeArticleen_US

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