Optical dispersion in spun nanocrystalline titania thin films

dc.authorid0000-0003-3222-9056en_US
dc.contributor.authorÇapan, Rifat
dc.contributor.authorChaure, Nandu B.
dc.contributor.authorHassan, Aseel
dc.contributor.authorRay, Asim Kumaren_US
dc.date.accessioned2019-10-17T07:09:00Z
dc.date.available2019-10-17T07:09:00Z
dc.date.issued2004en_US
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionÇapan, Rifat (Balikesir Author)en_US
dc.description.abstractSol-gel derived titanium dioxide (TiO2) films are prepared on silicon substrates using the method of spin-coating with different speeds from 1000 to 6000 rpm. Spectroscopic ellipsometric measurements provide dispersion of the refractive index and extinction coefficient within the wavelength range of 300-1000 nm. The behaviour is in agreement with the single oscillator model. Optical absorption is believed to be due to allowed indirect transition over the optical gap of approximately 3.2 eV.en_US
dc.identifier.doi10.1088/0268-1242/19/2/012
dc.identifier.endpage202en_US
dc.identifier.issn0268-1242
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-1242333086
dc.identifier.scopusqualityQ2
dc.identifier.startpage198en_US
dc.identifier.urihttps://doi.org/10.1088/0268-1242/19/2/012
dc.identifier.urihttps://hdl.handle.net/20.500.12462/7506
dc.identifier.volume19en_US
dc.identifier.wosWOS:000189377900012
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherIop Publishing Ltden_US
dc.relation.ispartofSemiconductor Science and Technologyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/embargoedAccessen_US
dc.subjectSpectroscopic Ellipsometryen_US
dc.subjectTio2en_US
dc.subjectDepositionen_US
dc.subjectCoatingsen_US
dc.subjectLayersen_US
dc.titleOptical dispersion in spun nanocrystalline titania thin filmsen_US
dc.typeArticleen_US

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